Electrostatic Chuck

PVD CVD Etch Ion Implantation Electrostatic Chuck

The Electrostatic Chuck (ESC)

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There are two types of the electrostatic chuck:  a coloumbic type, and the Johnsen-Rahbek type.  The surface of the latter type is made of a doped dielectric material.  When the wafer is placed on one surface of this dielectric surface, and a voltage is applied to a metal electrode on the opposite surface of this dielectric material, chucking of the wafer takes effect.   The controlled chucking is attributed to the Johnsen-Rahbek effect of the dielectric material.

The ESC can be operated in one of two configurations:  as a mono-polar, or bipolar configuration.  In the mono-polar configuration a dc-voltage is applied to the fixed metal electrode; the silicon substrate acts as the second electrode when the plasma is turned on.  In the bi-polar configuration, inter-digitized electrodes replaces the fixed electrode.  An alternating voltage is applied between the set of inter-digitized electrodes. 

The manufacturing and quality control of these dielectric materials are quite demanding.

Selected References

  1. D. Wright, D. Hartman, U. Sridharan, M. Kent, T. Jasinski and S. Kang J., Vac. Sci. Technol. A10 1065 (1992)
  2. D. Wright, L. Chen, P. Federlin and K. Forbes, J. Vac. Sci. Technol. B13 1910 (1995)
  3. Global Tech Corp.
  4. A. Johnsen and K. Rahbek, J. Inst. Electr. Eng. 61, 713 (1923)

SEMATECH has published other tutorial documents on electrostatic chucks:  93031533A-GEN, 90100362A-GEN, 93061683A-GEN, and  93031534A-GEN.  The interested reader will find abundant information in the patent literature and included in these documents.

 

 

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